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| NI举办2008在线自动化测试峰会 | ||||||||
| 2008-4-29 16:45:59 中国传动网 翻译 供稿 | ||||||||
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| 此次活动能聚集行业领先公司一起分享降低成本战略。 2008年4月28日消息，NI宣布举行第五届年度自动化测试峰会——以关注行业发展趋势，克服挑战为主题，通过在线讨论形式举行。2008自动化测试峰会将于6月5日在网上直播，将在欧洲、美洲和亚洲举行，为参与者提供一个可以与专家对话（我种语言）的机会。在这五天免费的活动中，参与者可以查阅关键性报告，观看技术讨论，参与现场问答及互动活动。 Averna 研发副总裁Jean-Yves Allard说：“NI自动化测试峰会为全球观众带来实时信息的同时，还涉及了与电子测试相结合的行业。作为一个参展商，我们可以在同一时间与来自四个大陆的参与者互动。技术展示外加由参展商提供的技术报告可为所有参与者提供一个很有价值的论坛信息，他们甚至都不用离开自己的桌子就能获得这些信息。” 来自世界范围内的领先的测试测量公司如：Averna, Cal-Bay, Intel, Microsoft 和Tektronix，在活动期间将分享他们的技术知识和最优办法。NI业务技术伙伴Mike Santori，将出席核心讨论：“测试中的效率优化”， 讨论的主题包括： • 降低软件开发成本 • 硬件设计的最新趋势 • 测试系统使用寿命的延长 • 测试工程小组讨论 • 参加者可在线报名或递交报名表  www.ni.com/testsummit National Instruments Hosts the Online Automated Test Summit 2008 Virtual Event Brings Industry-Leading Companies Together to Share Cost Reducing Strategies NEWS RELEASE – April 28, 2008 – National Instruments today announced the fifth annual Automated Test Summit, an online event featuring technical sessions focused on identifying trends and overcoming challenges in automated test. The Automated Test Summit 2008 will be hosted live on the Internet on June 5 and will be presented in the Americas, Europe and Asia, giving attendees the opportunity to speak with experts in various languages. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibition area. “The NI Automated Test Summit brings together a real-time global audience that covers every conceivable industry associated with electronics test,” said Jean-Yves Allard, vice president of research and development for Averna. “As an exhibitor, we interact live with booth visitors from four continents at the same time. The balance of technical presentations coupled with the latest offerings from the exhibitors provides a valuable forum for all participants – and they don’t even have to leave their desks.” Representatives from leading test and measurement companies worldwide such as Averna, Cal-Bay, Intel, Microsoft and Tektronix will share their technical expertise and best practices in sessions during the event. NI Business and Technology Fellow Mike Santori will present the keynote “Optimizing Efficiency in Test.” Session themes include: • Reducing software development cost • The latest trends in hardware design • Extending the life of your test system • Test engineering panel discussion Participants can register online and find a full list of technical sessions at www.ni.com/testsummit. 声明：本文为
中国传动网独家稿件，转载请务必注明出处。 |
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