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美国国家仪器有限公司举办自动化测试巅会

2007年04月02日 09:16:00 中国传动网

2007年3月27日消息,NI(美国国家仪器有限公司)举办了每年一届的第四届自动化测试巅会,此次测试的特色是集中鉴别和克服新挑战上。2007自动化测试巅会将于5月8日在网上实况转播,持续90天。在免费一日行活动中,参加者可浏览主旨介绍,观看技术会议、参与直播讨论和在展区与卖主间的互动活动。 “NI每年都要与行业技术领先企业和ATE提供商共同主办自动化测试巅会,向来自不同的电子技术领先制造商们的测试工程师和测试经理展示解决测试难题的最新测试策略和技术”NI自动化测试产品经理Kevin Bisking说,“为了使巅会让工程师们容易掌握测试方法来面对增长的工作量,NI将在网上举办今年的测试巅会。工程师们可以根据方便自己的方法学到最优的测试方法” 来自公司的代表们,如微软、英特尔、泰克(Tektronix)、Averna和BAE Systems将在活动举行期间分享他们的专业技术和最优方法。NI业务和技术伙伴Mike Santori将参加主旨为“研发下一代测试系统”的测试。德州仪器自动化基础设施经理Marvin Landrum,将参加下午的主旨为“发展全球测试程序战略”。技术途径包括下主题: 通过向普通测试系统架构转移降低成本 通过下一代技术改良系统性能 发展全球化测试程序战略 参考者可登录https://events.unisfair.com/index.jsp?code=press&seid=4&eid=177.在线注册 关于NI NI虚拟仪器领域的技术先驱和领导者。一个革新的观念已经改变了工程师和科学家们在工业、政治和学术领域关于测量和自动化的模式。 NI总部位于德州Austin,拥有员工3,900多名分布在40多个国家。2005年,公司卖出的产品遍及90个国家的25,000公司。 original text [COLOR=#708090][b]National Instruments Hosts Automated Test Summit 2007 Industry-Leading Companies to Share Best Practices on Automated Test Design at Online Event[/b] NEWS RELEASE – March 27, 2007 – National Instruments is hosting the fourth annual Automated Test Summit, featuring technical sessions focused on identifying trends and overcoming new challenges in automated test. The Automated Test Summit 2007 will be hosted live on the Internet May 8, and will be available on demand for 90 days. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibitor area. “National Instruments works with technology leaders and ATE suppliers every year to host the Automated Test Summit, which presents the latest test strategies and technologies addressing challenges faced by test engineers and senior managers from leading electronics manufacturers,” said Kevin Bisking, NI automated test product manager. “To make the summit more accessible to engineers facing increased workloads, NI is hosting the event online this year. Engineers will be able to learn the best practices in test development at their convenience.” Representatives from companies such as Microsoft, Intel, Tektronix, Averna and BAE Systems will share their technical expertise and best practices during the event. NI Business and Technology Fellow Mike Santori will present the keynote "Developing Next-Generation Test Systems." Marvin Landrum, automation infrastructure manager at Texas Instruments, will present the afternoon keynote “Strategies for Developing a Global Test Program.” Technical tracks feature the following topics: -Reducing cost by migrating to a common test system architecture -Improving system performance with next-generation technologies -Strategies for developing a global test program -Best practices for incorporating new measurements into a test system Participants can register online and find a full list of technical sessions at https://events.unisfair.com/index.jsp?code=press&seid=4&eid=177 [/COLOR]
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